-
Ptfe Chloroform C_AFM SurfaceChange Perovskite Magnets GaN TemperatureControl Step LateralPFM HighResolution non_contact ItoGlass SingleLayer UnivCollegeLondon Hafnia piezoelectric force microscopy PFM HexagonalBN Laser Gold Temasek_Lab PDMS Polyvinylidene_fluoride LightEmission AEAPDES NeodymiumMagnets medical self-assembly PtfeFilter MBE layers FAFailureAnlaysis NusEce MagneticPhase
Report image
If you found this image unacceptable, please let us know. We will review your report and take action if we determine this image is really unacceptable.
Lithography on Si substrate
Scanning Conditions
- System: NX10
- Scan Mode: Lithography
- Cantilever: ContscPt (k=0.2N/m, f=25kHz)
- Scan Size: 10μm×10μm
- Scan Rate: 1Hz
- Pixel: 1024×512
- Litho. mode: Tip bias mode
- Litho. Tip bias: Black -10V, White 0V