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Composite #Materials TPU CP-AFM MagneticForce self_healing LiftHeight ConductingPolymer Materials Vacuum Hexatriacontane Reading electrospinning Water AEAPDES Forevision Patterns PS_LDPE Filter GaN ForceVolumeImage Au111 MolybdenumDisulfide small_scan PolyvinylideneFluoride SAM Cross-section membrane ring shape Alloy FastScan Multiferroic_materials CalciumHydroxyapatite Fet HighAspect
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Multi-layer necking device defect
Scanning Conditions
- System : NX-Wafer
- Scan Mode: C-AFM
- Scan Rate : 2Hz
- Scan Size : 2μm×2μm
- Pixel Size : 512×256
- Cantilever : AD-2.8-AS (k=2.8N/m, f=75kHz)