-
Collagen Electrical&Electronics Display DNAProtein C_AFM membrane Spincast NUSNNI OrganicCompound MagneticArray EvatecAG Domain #EC Granada norganic C36H74 Leakage piezoelectric force microscopy ScanningSpreadingResistanceMicroscopy Fendb SicMosfet TCS NanoLithography pulsed_laser_deposition Adhesion food Polyvinylidene_fluoride Jason ThermalProperties Ram domain_switching Conducting Optoelectonics TemperatureControllerAFM Bacteria
Report image
If you found this image unacceptable, please let us know. We will review your report and take action if we determine this image is really unacceptable.
Semiconductor device, W-plug
Scanning Conditions
- System: NX10
- Scan Mode: Conductive AFM
- Cantilever: ElectriMulti75-G (k=3N/m, f=75kHz)
- Scan Size: 2μm×1μm
- Scan Rate: 0.3Hz
- Pixel: 512×256
- Sample bias: +1V