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Techcomp DeflectionOptics Polyvinylidene_fluoride CntFilm Sadowski SKPM Sapphire nanomechanical PhthalocyaninePraseodymium molecule BTO KAIST Pores MechanicalProperties STO ferromagnetic SFAs MBE Fe_film LowDensityPolyethylene FAFailureAnlaysis EPFL DOE PFM Wonseok chemical_compound China Mosfet Reduction Pinpoint PFM temperature_control MultiferroicMaterials BismuthFerrite Ceramic AM_KPFM
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Semi-fluorinated alkanes
Scanning Conditions
- System : FX10
- Scan Mode: Non-contact
- Scan Rate : 0.4 Hz
- Scan Size : 3μm×3μm
- Pixel Size : 1024×1024
- Cantilever : HQ: NSC14/CR-AU (k=5N/m, f=160kHz)