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Polarization phase_change GalliumPhosphide kelvin probe force microscopy Memory Fluoride domain_switching ElectroDeposition BiasMode FM_SKPM exfoliate Moire Resistance ForceVolumeMapping Sidewall Copolymer Ceramic Adhesion Metal-organicComplex ThermalProperties Worcester_Polytechnic_Institute cannabinoid flakes Polydimethylsiloxane SicMosfet Defects polyvinyl acetate NTU biocompatible Electical&Electronics Inorganic_Compound Change Bmp HafniumDioxide temp_control
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Mechanical Exfoliated WS2
Scanning Conditions
- System: NX10
- Scan Mode: AM-KPFM
- Cantilever: NSC36Cr-Au A (k=1N/m, f=90kHz)
- Scan Size: 15μm×15μm
- Scan Rate: 0.4Hz
- Pixel: 512 × 256
- Scan Mode: AM-KPFM
- Cantilever: NSC36Cr-Au A (k=1N/m, f=90kHz)
- Scan Size: 15μm×15μm
- Scan Rate: 0.4Hz
- Pixel: 512 × 256