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Wang Bismuth LaAlO3 Pzt TCS Workfunction Pvdf Heat Tapping AEAPDES heterojunctions semifluorinated alkane OxideLayer Granada GalliumPhosphide Semiconductor SiWafer EPFL Corrosion CuParticle hard_disk DIWafer light_emission Pinpoint Pyroelectric DOE Zagreb MagneticForce PvdfFilm LateralForce hydrocarbon AM_KPFM FailureAnlaysis AIN UnivMaryland
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SnS2 Flakes
Scanning Conditions
- System: NX10
- Scan Mode: Non-contact
- Cantilever: AC240TS (k=2N/m, f=70kHz)
- Scan Size: 10μm×10μm
- Scan Rate: 0.4Hz
- Pixel Size: 256 × 256
- Scan Mode: Non-contact
- Cantilever: AC240TS (k=2N/m, f=70kHz)
- Scan Size: 10μm×10μm
- Scan Rate: 0.4Hz
- Pixel Size: 256 × 256