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CrossSection CVD SolarCell organic_polymer Korea Implant semifluorinated_alkanes Boundary EFM hetero_structure Hexatriacontane INSPParis AIN LDPE PS_PVAC ConductiveAFM silicon_carbide TappingMode University_of_Regensburg cross section Silver Sic Terrace HydroGel Nanostructure TemperatureControllerAFM KAIST pulsed_laser_deposition Nanotechnology SRAM ContactMode lithography Blend fluoroalkane GaN
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Hard Disk Media
Scanning Conditions
- System: NX10
- Scan Mode: Non-contact
- Cantilever: SSS-NCHR (k=42N/m, f=300kHz)
- Scan Size: 1μm×1μm, 0.3μm×0.3μm
- Scan Rate: 0.5Hz, 1Hz
- Pixel Size: 512×512, 256×256
- Scan Mode: Non-contact
- Cantilever: SSS-NCHR (k=42N/m, f=300kHz)
- Scan Size: 1μm×1μm, 0.3μm×0.3μm
- Scan Rate: 0.5Hz, 1Hz
- Pixel Size: 512×512, 256×256