-
AtomicLayer CeNSE_IISc Varistor Resistance self-assembly Sulfur PhaseImaging Phenanthrene Celebration UnivMaryland ConductiveAFM VinylAlcohol Global_Comm Polytetrafluoroethylene TCS lithography ForceVolumeImage Terrace Aggregated_molecules Battery EvatecAG CaMnO3 Copper Tin sulfide Cancer BTO Zhi Workfunction self_assembly Stiffness SiliconOxide Ferrite Yeditepe DLaTGS dielectric trench
Report image
If you found this image unacceptable, please let us know. We will review your report and take action if we determine this image is really unacceptable.
BTO
Scanning Conditions
- System: XE7
- Scan Mode: DC-EFM(Vertical)
- Cantilever: ElectriMulti75G (k=3N/m, f=75kHz)
- Scan Size: 20μm×20μm
- Scan Rate: 0.2Hz
- Pixel: 256×256
- Sample Bias: 0V
- Tip Bias: 1V ac
- Scan Mode: DC-EFM(Vertical)
- Cantilever: ElectriMulti75G (k=3N/m, f=75kHz)
- Scan Size: 20μm×20μm
- Scan Rate: 0.2Hz
- Pixel: 256×256
- Sample Bias: 0V
- Tip Bias: 1V ac