-
Liquid CeramicCapacitor SrO pinpoint mode DNA TransitionMetal Adhesion HDD Device SiliconeOxide contact GlassTemperature Ceramics F14H20 NiFe Growing cooling Gallium_Arsenide OpticalElement FrictionalForce molecular_self_assembly vertical_PFM Semiconductor Alloy doped Dental AAO Titanate dielectric trench flakes silicon_oxide PVAC Change UnivCollegeLondon ForceMapping
Report image
If you found this image unacceptable, please let us know. We will review your report and take action if we determine this image is really unacceptable.
Floppy
Scanning Conditions
- System: NX10
- Scan Mode: CP-AFM
- Cantilever: CDT-NCHR (k=80N/m, f=300kHz)
- Scan Size: 10μm×10μm
- Scan Rate: 1Hz
- Pixel: 256×256
- Scan Mode: CP-AFM
- Cantilever: CDT-NCHR (k=80N/m, f=300kHz)
- Scan Size: 10μm×10μm
- Scan Rate: 1Hz
- Pixel: 256×256