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Yeditepe Defect lithography mono_layer Genetic SingleLayer Optoelectronic plastics dichalcogenide Silicon CuParticle Piezo Optical Sapphire SetpointMode thermal_conductivity Photovoltaics HumanHair MagneticForce PolyStylene LDPE Oxidation YszSubstrate Conducting DIWafer C36H74 Yeditepe_University TipBiasMode Temasek_Lab IVSpectroscopy Insulator Aluminium_Oxide Polarization CompactDisk alkanes
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MoS2
Scanning Conditions
- System: NX10
- Scan Mode: AM-KPFM
- Cantilever: ElectriMulti75 (k=3 N/m, f=75kHz)
- Scan Size: 10μm×10μm
- Scan Rate: 0.5Hz
- Pixel: 256×256