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PVAP3HT graphene_hybrid Wafer Polyimide Inorganic_Compound LateralPFM Fe_film PyroelectricDetector Tin sulfide AtomicLayer SelfAssembly Trench FrictionForce Polystyrene PtfeFilter NanoLithography AlkaneFilm Aggregated_molecules FailureAnlaysis Polyurethane Au111 STO MonoLayer VerticalPFM DomainSwitching NtuEee PVAC self_assembly Tungsten_disulfide Mapping light_emission PatternedSapphireSubstrat ConductiveAFM CrAu cross section
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HOPG
Scanning Conditions
- System: NX10
- Scan Mode: KPFM
- Cantilever: NSC36Cr-Au (k=2N/m, f=130kHz)
- Scan Size: 20μm×20μm
- Scan Rate: 0.2Hz
- Pixel: 256×512