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piezoelectric force microscopy Topography I-VSpectroscopy SiliconCrystal SThM ContactModeDot AEAPDES Conducting DentalProsthesis SingleLayer Vanadate MultiLayerCeramicCapacitor Molybdenum SingleCrystal ElectrostaticForceMicroscopy Pattern ScanningSpreadingResistanceMicroscopy ScanningKelvinProbeMicroscopy Semiconductor Display 2dMaterials Fendb SAM LiNbO3 Galfenol tip_bias_mode SICM Chloroform Dental SolarCell CBD molecule AM_KPFM GlassTemp IMT_Bucharest
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MoS₂
Scanning Conditions
- System : NX10
- Scan Mode: AM KPFM
- Scan Rate : 0.4Hz
- Scan Size : 1μm×1μm
- Pixel Size : 256×256
- Cantilever : NSC36 Cr-Au C (k=0.6N/m, f=65kHz)