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NanoLithography Spincast PyroelectricDetector NCM\ TipBiasMode mechanical property MechanicalProperties Indium_tin_oxide Sperm Copolymer Layer RedBloodCell Conductivity ElectrostaticForceMicroscopy Friction dielectric trench Domain FrictionForce Zhi YszSubstrate Galfenol Hafnium_dioxide CompactDisk TransitionMetal IIT-chennai Copper Floppy Mfm DNA phase_change Annealed HighResolution Heat MESA structure Sidewall
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hBN-few layer Graphene
Scanning Conditions
- System : NX10
- Sample bias: 1.75 V
- Scan Mode: C-AFM
- Scan Rate : ALL 0.5Hz
- Scan Size : 200nm×200nm
- Pixel Size : 2048×2048
- Cantilever : AD-2.8-AS (k=2.8N/m, f=75kHz)