-
Holes MechanicalProperty FloppyDisk Worcester_Polytechnic_Institute contact Topography PVAC Vac OpticalElement mfm_amplitude Gallium_Arsenide WS2 Formamidinium_lead_iodide ElectroDeposition Subhajjit UTEM Growing LateralPFM hard_disk MESA structure Hydroxyapatite Mobile IVSpectroscopy ScanningTunnelingMicroscopy IMT_Bucharest PolyvinylAcetate ShenYang fe_nd_b AM_KPFM PhaseImaging BFO hydrocarbon Optic gallium_nitride PolyStylene
Report image
If you found this image unacceptable, please let us know. We will review your report and take action if we determine this image is really unacceptable.
2L-MoS₂ (1/3)
Scanning Conditions
- System : FX40
- Sample bias: 0.25 V
- Scan Mode: C-AFM, LFM
- Scan Rate : 4 Hz
- Scan Size : 2.5μm×2.5μm
- Pixel Size : 512×512
- Cantilever : ContSCPt (k=0.2N/m, f=25kHz)