-
nanomechanical MonoLayer vertical_PFM ito_film Yttria_stabilized_Zirconia Morphology NtuEee PpLdpe pinpoint mode ScanningThermalMicroscopy conductive Melt molecular_self_assembly polyvinyl acetate PVAC NeodymiumMagnets 2-vinylpyridine TipBiasMode Transparent neodymium_magnets HexagonalBoronNitride Ferroelectric WS2 Magnets Inorganic_Compound LiIonBattery PiezoelectricForceMicroscopy NCM pulsed_laser_deposition AM_KPFM TemperatureControllerAFM HfO2 CBD Metal Fiber
Report image
If you found this image unacceptable, please let us know. We will review your report and take action if we determine this image is really unacceptable.
Lithography on compact disk
Scanning Conditions
- System: NX10
- Scan Mode: XEL
- Cantilever: NCHR (k=42N/m, f=300kHz)
- Scan Size: 7.5μm×7.5μm
- Scan Rate: 0.5Hz
- Pixel: 256×256
- Scan Mode: XEL
- Cantilever: NCHR (k=42N/m, f=300kHz)
- Scan Size: 7.5μm×7.5μm
- Scan Rate: 0.5Hz
- Pixel: 256×256