-
Gallium_Arsenide TempControl IVSpectroscopy thermal_conductivity SoftSample Ceramics StyreneBeads Alkane ForceDistanceSpectroscopy DataStorage Cell Steps PinpointPFM Hole conductive TemperatureControlledAFM Conductive AFM self_healing self-assembly GaP Sapphire cooling Yeditepe oxide_layer TiO2 Annealing Zagreb Biofilm PetruPoni_Institute Vac UnivOfMaryland Mechanical LightEmission Leakage Adhesion
Report image
If you found this image unacceptable, please let us know. We will review your report and take action if we determine this image is really unacceptable.
Lithography on compact disk
Scanning Conditions
- System: NX10
- Scan Mode: XEL
- Cantilever: NCHR (k=42N/m, f=300kHz)
- Scan Size: 7.5μm×7.5μm
- Scan Rate: 0.5Hz
- Pixel: 256×256
- Scan Mode: XEL
- Cantilever: NCHR (k=42N/m, f=300kHz)
- Scan Size: 7.5μm×7.5μm
- Scan Rate: 0.5Hz
- Pixel: 256×256