For too long the field of atomic force microscopy (AFM) has been saddled with the stigma of being a complex technique for novices to pick up. A myriad of scanning parameters to navigate and the art of locating sample surfaces are some of the biggest obstacles new users have to face when learning AFM. No one should ever have to learn anything, including AFM, through pure trial and error.
But now we can say goodbye to this tedious past.
Now there's Park SmartScan—our new Park AFM operating software.
In this new software the user only needs to define two parameters: the size of the scan area and whether he prefers quality or speed in collecting the image—the software will perform the imaging by itself in Auto mode. The parameters, including setpoint, gain, and scan speed, will be optimized by the software in order to produce an accurate image. Furthermore, advanced AFM users will still have access to all scanning parameters in Manual mode. In addition, with the help of a fast approach technique, finding the sample surface and area of interest has been significantly simplified.
During this demonstration, we will perform tip and sample replacement then imaging of samples in non-contact mode using Park SmartScan.
Presented by Dr. Ardavan Zandiatashbar
Applications Scientist, Park Systems Inc.
