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#EC Scratch Ananth Domain LateralForce DeoxyribonucleicAcid NeodymiumMagnets ConductingPolymer TappingMode Austenite STM MeltingPoint #Materials Bacteria LiftHeight Temasek_Lab PS_PVAC Flake IVSpectroscopy Sidewall amplitude_modulation Potential Layer SrO Carbon Permalloy Optical Piranha hard_disk CarbonNanotube cooling self_assembly Litho ContactModeDot SiliconeOxide
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Imprint sample
Scanning Conditions
- System: NX10
- Scan Mode: Non-contact
- Cantilever: AR5T-NCHR (k=42N/m, f=300kHz)
- Scan Size: 20μm×20μm
- Scan Rate:0.25Hz
- Pixel: 256×256
- Scan Mode: Non-contact
- Cantilever: AR5T-NCHR (k=42N/m, f=300kHz)
- Scan Size: 20μm×20μm
- Scan Rate:0.25Hz
- Pixel: 256×256