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GaAs Filter SRAM Jason SiliconOxide TriGlycineSulphate Molybdenum LiftMode PolyimideFilm align SAM NiFe nanomechanical MolybdenumDisulfide TiO2 AM_SKPM 3-hexylthiophene PS_PVAC Temperature HexagonalBN Imprint SmalScan AmplitudeModulation mfm_amplitude hard_disk_media TyphimuriumBiofilm 2dMaterials FrictionForce MeltingPoint LithiumNiobate Pyroelectric Kevlar Optoelectronic CrystalGrowing Calcium
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TSV Cu pad oxidation
Scanning Conditions
- System : NX-Wafer
- Scan Mode: Non-contact
- Scan Rate : All 1 Hz
- Scan Size : 40μm×40μm
- Pixel Size : All 512×512
- Cantilever : OMCL-AC160TS (k=26N/m, f=300kHz)