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contact Annealing #Materials C_AFM Fluoride CuParticle margarine SICM semifluorinated_alkane Gold KPFM light_emission MolybdenumDisulfide ScratchMode Magnetic PtfeMembrane Heating SiWafer SmallScan cannabidiol Croatia TemperatureControllerAFM PolyvinylAcetate DentalProsthesis Roughness Film fluorocarbon PhthalocyaninePraseodymium aluminum_nitride self-assembled_monolayer PhaseImaging Polyvinylidene_fluoride ElectrostaticForceMicroscopy TipBiasMode Wafer
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Defect of LinbO₃
Scanning Conditions
- System : FX40
- Scan Mode: Non-contact
- Scan Rate : 0.3 Hz
- Scan Size : 10μm×10μm
- Pixel Size : 1024×512
- Cantilever : SCOUT 350 (k=42N/m, f=350kHz)