-
Ananth Patterns dielectric_trench ConductiveAFM Electrical&Electronics Photovoltaics Chemical_Vapor_Deposition neodymium_magnets silicon_oxide Piezoelectric Hafnium_dioxide Leakage ThinFilm AM_SKPM Sidewall PolymerBlend Fujian NUS_Physics Potential TemperatureControllerStage Platinum INSPParis NiFe PinPointMode molecule LiquidImaging PS_PVAC Chromium hetero_structure molecular_beam ShenYang SmalScan atomic_layer Pore Current
Report image
If you found this image unacceptable, please let us know. We will review your report and take action if we determine this image is really unacceptable.
Carbon Nanotube on Si
Scanning Conditions
- System: XE7
- Scan Mode: SThM, KPFM, PinPoint CP-AFM
- Cantilever: Nanothermal probe, NCST-Au (k=7.4N/m, f=160kHz), CDT-CONTR (k=0.5N/m, f=20kHz)
- Scan Size: 0.6μm×0.6μm
- Scan Rate: 0.5Hz, 0.5Hz, 0.15Hz
- Pixel: 256×128
- Scan Mode: SThM, KPFM, PinPoint CP-AFM
- Cantilever: Nanothermal probe, NCST-Au (k=7.4N/m, f=160kHz), CDT-CONTR (k=0.5N/m, f=20kHz)
- Scan Size: 0.6μm×0.6μm
- Scan Rate: 0.5Hz, 0.5Hz, 0.15Hz
- Pixel: 256×128