-
Liquid CVD ThermalConductivity Scanning_Thermal_Microscopy Optical graphene_hybrid CP-AFM flakes Dimethicone NanoLithography HOPG Implant Dopped Battery temperature controller AFM Sulfur CastIron Praseodymium Terrace Hexylthiophene Tin sulfide Current TyphimuriumBiofilm Optic Nanotechnology FuelCell OrganicSemiconductor UnivMaryland Device Tungsten_disulfide C60H122 piezoelectric force microscopy SoftSample ScanningTunnelingMicroscopy Growing
Report image
If you found this image unacceptable, please let us know. We will review your report and take action if we determine this image is really unacceptable.
Atomic steps on GaP(Gallium Phosphide) layer on Si
Scanning Conditions
- System: NX20
- Scan Mode: Non-contact
- Cantilever: PPP-NCHR (k=42N/m, f=300kHz)
- Scan Size: 5μm×5μm
- Scan Rate: 1Hz
- Pixel: 512×512