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ForceVolume Aluminium_Oxide Fe_film Treatment SrTiO3 Neodymium ScratchMode GranadaUniv cooling Switching OrganicCompound STO CntFilm NUSNNI Terrace Galfenol MfmAmplitude FrictionalForceMicroscopy silicon_oxide FailureAnlaysis HOPG Vortex NeodymiumMagnets Bacteria SFAs Piranha ContactModeDots MechanicalProperty Piezo Laser pulsed_laser_deposition 3-hexylthiophene Transparent PolycrystallineFerroelectricBCZT Thermal
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LiNbO3 wafer
Scanning Conditions
- System: NX10
- Scan Mode: Non-contact
- Cantilever: AC55TS (k=85N/m, f=1600kHz)
- Scan Size:20μm×20μm, 2.5μm×2.5μm
- Scan Rate: 5Hz, 10Hz
- Pixel: 512×512, 256×256
- Scan Mode: Non-contact
- Cantilever: AC55TS (k=85N/m, f=1600kHz)
- Scan Size:20μm×20μm, 2.5μm×2.5μm
- Scan Rate: 5Hz, 10Hz
- Pixel: 512×512, 256×256