-
ElectroChemical Fujian Modulus BoronNitride Electical&Electronics Optoelectonics Collagen FFM Tin disulfide LDPE neodymium_magnets Titanate Sphere contact TipBiasMode ForceVolumeImage Pattern Growth HydroGel Inorganic SolarCell Polyaniline Vanadate Al2O3 MechanicalProperties Solar ReflexLens flakes Display PinpointPFM Nanotechnology kelvin probe force microscopy Filter margarine DNAProtein
Report image
If you found this image unacceptable, please let us know. We will review your report and take action if we determine this image is really unacceptable.
SiC MOSFET
Scanning Conditions
- System: NX-Hivac
- Scan Mode: SSRM
- Cantilever: Full diamond (k=27 N/m)
- Scan Size: 2μm×2μm
- Scan Rate: 0.5Hz
- Pixel: 256×512
- Sample Bias: +2.5V
- Scan Mode: SSRM
- Cantilever: Full diamond (k=27 N/m)
- Scan Size: 2μm×2μm
- Scan Rate: 0.5Hz
- Pixel: 256×512
- Sample Bias: +2.5V