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TipBiasMode Wafer CeNSE_IISc exfoliate Indent Floppy Ucl Titanate ScanningSpreadingResistanceMicroscopy Graphite BTO DataStorage Cross-section thermal_conductivity IVSpectroscopy NUS Water flakes Resistance Hexatriacontane Alloy Lateral fluoroalkane UnivMaryland bias_mode ito_film Polydimethylsiloxane Polarization SingleLayer Transparent SKPM MESA structure neodymium_magnets EFMAmplitude Roughness
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Cutting Graphene
Scanning Conditions
- System : FX40
- Scan Mode: Contact after lithography
- Scan Rate : 0.7 Hz
- Scan Size : 30μm×30μm
- Pixel Size : 256×256
- Cantilever : ElectricMulti75-G (k=3N/m, f=75kHz)
- Lithography condition : Force 500 nN, writing speed 0.1μm/s, AC bias 10 V @ 40kHz