-
OpticalElement FFM Insulator DeflectionOptics SetpointMode LiBattery Self-assembledMonolayer Heat Global_Comm Treatment Ptfe India FM-KPFM BaTiO3 HDD TemperatureControllerStage NTU self_assembly molecule Flake EvatecAG Croatia PECurve INSP FailureAnalysis ULCA fe_nd_b Polyurethane Biology Wafer NUS_Physics DIWafer WPlug Roughness 3-hexylthiophene
Report image
If you found this image unacceptable, please let us know. We will review your report and take action if we determine this image is really unacceptable.
HOPG
Scanning Conditions
- System : FX40
- Scan Mode: Sideband, AM KPFM
- Scan Rate : 0.55 Hz
- Scan Size : 10μm×10μm
- Pixel Size : 256×256
- Cantilever : NSC36 Cr-Au C (k=0.6N/m, f=65kHz)