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Device Polyvinylidene piezoelectric force microscopy PetruPoni_Institute AnodizedAluminumOxide PhaseTransition Ceramics SFAs 3-hexylthiophene Yttria_stabilized_Zirconia cannabis SiliconOxide Composite AdhesionForce Fluoride ThermalConductivity Gong OpticalWaveguide HACrystal Strontium Chloroform HiVacuum Pores ConductiveAFM HighAcpectRatio MultiferroicMaterials NeodymiumMagnets small_scan CrystalGrowing GaP tip_bias_mode ContactModeDot Tungsten_disulfide Hair Mobile
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HOPG
Scanning Conditions
- System : FX40
- Scan Mode: Sideband, AM KPFM
- Scan Rate : 0.55 Hz
- Scan Size : 10μm×10μm
- Pixel Size : 256×256
- Cantilever : NSC36 Cr-Au C (k=0.6N/m, f=65kHz)