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Mosfet ConductiveAFM CastIron Conductance Calcium Conduct VortexCore Aluminium_Oxide MetalCompound Vanadate CarbonNanotube C_AFM Boundary IISCBangalore ito_film PS_LDPE Polytetrafluoroethylene atomic_layer Ceramics flakes Mobile ForceMapping FFM Composition Ni-FeAlloy OxideLayer Phenanthrene Copolymer Imprint DomainSwitching FM_KPFM FailureAnlaysis Sapphire FrictionForce CrystalGrowing
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PP/LDPE polymer blend
Scanning Conditions
- System: NX20
- Scan Mode: Pinpoint mechanical
- Cantilever: FMR (k=2N/m, f=75kHz)
- Scan Size: 10μm×10μm
- Scan Rate: 0.35Hz
- Pixel: 256×256
- Modulus calculation model: Hertzian