-
AM_KPFM ReflexLens InsulatorFilm Platinum GlassTemperature Imprint Glass RedBloodCell TemperatureControl AM_SKPM CuFoil Ferroelectric Ceramics MultiferroicMaterials Wonseok NUS_Physics Beads Sadowski single_layer dielectric trench PolyvinylideneFluoride Film FailureAnalysis InorganicCompound ImideMonomer DiffractiveOpticalElements FastScan F14H20 Writing Fluoride Pattern Gallium_Arsenide LightEmiting Pyroelectric GranadaUniv
Report image
If you found this image unacceptable, please let us know. We will review your report and take action if we determine this image is really unacceptable.
WLI image of wafer ID mark
Scanning Conditions
- System : NX-Hybrid WLI
- Scan Mode: WLI
- Field of view: 182μm×182μm