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Polytetrafluoroethylene PolymerBlend Polypropylene ScanningIon-ConductanceMicroscopy BariumTitanate ForceMapping CeramicCapacitor Foil gallium_nitride Friction nanomechanical PtfeFilter Sphere Electrode Au111 hydrocarbon IRDetector Mechinical Workfunction TungstenDeposition HighAcpectRatio Self-assembledMonolayer BismuthVanadate C36H74 Indium_tin_oxide Inorganic HighResolution AAO IndiumTinOxide Nickel Wang BCZT Hexylthiophene OpticalWaveguide ChemicalCompound
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SRAM
Scanning Conditions
- System: NX10
- Scan Mode: CP-AFM
- Cantilever: CDT-NCHR (k=80N/m, f=400kHz)
- Scan Size: 3μm×3μm
- Scan Rate: 0.5Hz
- Pixel: 256×256
- Sample Bias: 0.5V
- Scan Mode: CP-AFM
- Cantilever: CDT-NCHR (k=80N/m, f=400kHz)
- Scan Size: 3μm×3μm
- Scan Rate: 0.5Hz
- Pixel: 256×256
- Sample Bias: 0.5V