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vertical_PFM Blend doped Dopped conductive Polymer DeflectionOptics Transparent Wang OpticalWaveguides temperature_control FailureAnlaysis LateralForceMicroscopy frequency_modulation 2d_materials Vanadate Zagreb Piezo mechanical_property Roughness DataStorage Conduct Metal-organicComplex exfoliate LiBattery Device FM-KPFM PtfeFilter MetalCompound Biofilm SelfAssembly Calcium MeltingPoint LiNbO3 StrontiuTitanate
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Polymer patterns on Si (2/2)
Scanning Conditions
- System: NX10
- Scan Mode: KPFM
- Cantilever: NSC36Cr-Au (k=1N/m, f=90kHz)
- Scan Size: 10μm×10μm
- Scan Rate: 0.2Hz
- Pixel: 512×256