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InorganicCompound Cobalt STO TappingMode SiliconeOxide HBN piezoelectric force microscopy SRAM Gallium_Arsenide Growing Wafer Dimethicone NUSNNI Yttria_stabilized_Zirconia MagneticPhase Terrace ThinFilm Polyaniline FrequencyModulation Cobalt-dopedIronOxide CopperFoil HighAcpectRatio Led ContactModeDots mechanical_property TemperatureControllerAFM silicon_carbide DNAProtein Copper hetero_structure AlkaneFilm Change hard_disk 3-hexylthiophene hydrocarbon
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MoS2 (1/2)
Scanning Conditions
- System: NX10
- Scan Mode: KPFM
- Cantilever: NSC36Cr-Au (k=1N/m, f=90kHz)
- Scan Size: 30μm×30μm
- Scan Rate: 0.1Hz
- Pixel: 512×1024