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Materials Wafer SelfAssembly Bacteria MolecularSelfAssembly conductive Scanning_Thermal_Microscopy Composition Pore LiftHeight semifluorinated_alkanes SmalScan mfm_amplitude ForceMapping multi_layer IMT_Bucharest CeramicCapacitor Bmp NTU aluminum_nitride Spincast Film Adhesion Butterfly hard_disk_media DentalProsthesis STM Reduction Laser HighAcpectRatio HACrystal SSRM Global_Comm hydrocarbon Transparent
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Tungsten coated wafer
Scanning Conditions
- System: NX10
- Scan Mode: NCM
- Cantilever: NCHR (k=42N/m, f=300kHz)
- Scan Size: 5μm×5μm
- Scan Rate: 0.3Hz
- Pixel: 512×5126