-
Vortex MagneticArray OxideLayer Vac amplitude_modulation Bismuth WWafer suspended_graphene thermal_property Croatia ThinFilm BariumTitanate Aggregated_molecules ScanningTunnelingMicroscopy domain_switching thermal_conductivity SRAM temperature_control LiIonBattery LiquidImaging electrospinning CNT PolymerBlend Optoelectronic tip_bias_mode PhaseChange IMT_Bucharest FrequencyModulation norganic Electronics InorganicCompound Celebration SicMosfet PolyStylene Gallium_Arsenide
Report image
If you found this image unacceptable, please let us know. We will review your report and take action if we determine this image is really unacceptable.
Tungsten coated wafer
Scanning Conditions
- System: NX10
- Scan Mode: NCM
- Cantilever: NCHR (k=42N/m, f=300kHz)
- Scan Size: 5μm×5μm
- Scan Rate: 0.3Hz
- Pixel: 512×5126