-
PtfeMembrane Laser SingleLayer Yeditepe_University LDPE mono_layer DataStorage Calcite dielectric trench P3HT mfm_amplitude thermal_property vertical_PFM Optic GranadaUniv TungstenThinFilmDeposition rubber Silicon OxideLayer silicon_carbide MultiferroicMaterials DeflectionOptics Polytetrafluoroethylene PrCurve self-assembly flakes Leakage Permalloy Led Solution Reading Morphology ScratchMode Optical Ucl
Report image
If you found this image unacceptable, please let us know. We will review your report and take action if we determine this image is really unacceptable.
Mo film
Scanning Conditions
- System : NX-Wafer
- Scan Mode: Non-contact
- Scan Rate : 0.5 Hz, 0.8 Hz
- Scan Size : 5μm2, 15μm2
- Pixel Size : All 1024×512
- Cantilever : OMCL-AC160TS (k=26N/m, f=300kHz)