-
Insulator Etch Logo LMF Pzt Self-assembledMonolayer MBE IVSpectroscopy KAIST Resistance Semiconductor Vanadate Crystal ThermalConductivity CaMnO3 Worcester_Polytechnic_Institute SrTiO3 Mechanical Electrode Yttria_stabilized_Zirconia Electronics Aluminium_Oxide piezoelectric force microscopy Wildtype Alkane Defect small_scan Conductivity Morphology vertical_PFM Cell Mfm MultiLayerCeramicCapacitor GalliumPhosphide domain_switching
Report image
If you found this image unacceptable, please let us know. We will review your report and take action if we determine this image is really unacceptable.
MoS2 (2/2)
Scanning Conditions
- System: NX10
- Scan Mode: KPFM
- Cantilever: NSC36Cr-Au(k=1N/m, f=90kHz)
- Scan Size: 30μm×30μm,10μm×10μm
- Scan Rate: 0.1Hz
- Pixel: 512×1024