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TemperatureControllerAFM Corrosion HighResolution AEAPDES dielectric_trench Croatia OrganicCompound Organic Wang Grain Thermoplastic_polyurethane Laser CP-AFM NUSNNI TungstenDeposition temp_control Annealed BiVO4 Mapping YszSubstrate MultiferroicMaterials MagneticPhase CuSubstrate GaAs Tin sulfide Hexacontane IISCBangalore Zagreb VerticalPFM Insulator Stiffness 3-hexylthiophene polymeric_arrays Treatment Inorganic
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Scanning Conditions
- System: XE7
- Scan Mode: DC-EFM(Vertical)
- Cantilever: ElectriMulti75G (k=3N/m, f=75kHz)
- Scan Size: 20μm×20μm
- Scan Rate: 0.2Hz
- Pixel: 256×256
- Sample Bias: 0V
- Tip Bias: 1V ac
- Scan Mode: DC-EFM(Vertical)
- Cantilever: ElectriMulti75G (k=3N/m, f=75kHz)
- Scan Size: 20μm×20μm
- Scan Rate: 0.2Hz
- Pixel: 256×256
- Sample Bias: 0V
- Tip Bias: 1V ac